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ISTEQ has developed and manufactures a wide range of scientific equipment (detectors and spectrometers) for recording and characterization of X-rays and short-wave ultraviolet  radiation.

Our products provide an absolutely calibrated and spatially/temporally resolved characterization of plasma, including a femtosecond laser plasma, high-power Z-pinch plasma and DPP/LPP EUV plasma.

VUV spectrometer AGS

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Amplitude grating spectrometer for quantitative measurements ranging from 6 up to 200 nm.

Read more: XUV-VUV spectrometer AGS
MCP Detector
 
We provide a complete program of gated MCP (micro channel plate) detectors for visualization of X-ray and VUV radiation.
Read more: MCP Detector
X-Ray Spectrometer HD-1
 
Extra compact X-Ray spectrometer which provides  absolute spectral measurement of low intensity X-ray radiation sources,  X-ray fluorescence analysis, EXAFS, etc.
Read more: X-Ray Spectrometer HD-1
VUV Spectrometer GIS
 
A new type of grazing-incidence VUV spectrometer with extended spectral range (up to 80nm), provided by a specially designed grating.
Read more: GIS
VUV Spectrometer GISM
 
Powerful and flexible spectrometer, specially developed for EUV plasma characterization in a spectral range up to 40nm.
Read more: GIS-M
Rowland's Spectrometer
 
Grazing incidence spectrometer built in the Rowland circle configuration. This compact instrument allows the user to obtain a high quality time resolved spectra between 3 and 36nm.
Read more: Rowland’s spectrograph